Showing results: 166 - 180 of 876 items found.
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Fraunhofer IPM
The "QSDrive Scan Kit" evaluation kit enables small and medium-sized companies in particular to operate ResoLin components from the Fraunhofer IPMS in accordance with the specifications without the time-consuming in-house development of control electronics. The evaluation kit consists of a ResoLin component – a cardanic MEMS scanner with a linear axis and an optional, orthogonally oriented resonant axis – and control electronics that enable the components to be operated with an optimized trajectory supplied. The component is held by a scan head, which is also included in the scope of delivery and which, thanks to its special construction, can easily be integrated into common optical test setups. Depending on the design of the MEMS component, controlled operation of the component and synchronized operation of the resonant axis are also possible. The function is controlled by software that communicates with the electronics via USB.
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Huntron® Trackers® -
Huntron
Adding diagnostic tools to enhance your circuit board test capabilities is an important part of any electronic repair environment.Huntron Tracker power-off circuit board test uses analog signature analysis to detect and isolate component faults on boards beyond power-on functional testing. By comparing Tracker signatures from a working circuit board to the signatures of a non-working board, you can troubleshoot down to the component level.
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Aero Nav Laboratories, Inc.
The dielectric withstanding voltage test (also called high-potential, over-potential voltage-breakdown, or dielectric-strength test) consists of the application of a voltage significantly higher than rated voltage for a specific time, between mutually insulated portions of a component part or between insulated portions and ground. This is used to prove that the component part can operate safely at its rated voltage and withstand momentary over-potentials due to switching, surges, and other similar phenomena.
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Siborg Systems Inc
LCR-Reader-MPA combines tweezer probes with a powerful LCR/ESR-meter that is able to determine the type of component and best test parameters before measuring with a 0.1% basic accuracy. The device will display the main impedance value, any secondary values such as ESR, Q or D, component type and test parameters used instantly on a bright backlit LCD display. The 1 oz. device is very portable and ideal for fieldwork.
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CSM Products, Inc.
For measurement on high-voltage components with certified safety – in test drives, field tests, and on test benches: CSM’s high-voltage measurement systems are specifically designed for the safe and accurate acquisition of temperatures and analog sensor signals in HV environments, especially in electric and hybrid vehicles.
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Loranger International Corporation
Loranger International Corporation designs and manufactures thousands of socket styles for the burn-in and test of semiconductors and electronic components. Some of the socket styles are listed below.
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Doyle Manufacturing, Inc.
Production Connectors for the manufacturing and testing of component assemblies. Handheld Production Connectors for assembly lines. Machine Mounted Test Connectors. Part-in-Place detection.
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Sanwood Environmental Chambers Co ., Ltd.
Sand Dust chamber provide an environment to test the exposure of automotive and electronic components to concentrated levels of dust in order to validate product seal integrity.
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ROTO-PUSH -
Foerster Instruments, Incorporated
The ROTO-PUSH test station, which is integrated in production lines, serves to test cylindrical components for cracks in the liner surface. The testing configuration has to be rotated for automatic crack testing. After the test, the test pieces are sorted and separated. The continuous test run ensures a high testing rate, which increases profitability.
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Shanghai Jiuzhi Electric Co., Ltd.
Our advanced power and distribution transformer test system and components are used for testing transformer up to 1000kV/600MVA. Samgor perform the following tests in accordance with ANSI / IEEE C57.12.90 and IEC 76 latest edition standards.
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S-113 -
Notice
The Pattern Generator slot module of FOTS system is an efficient module for the characterization and test of external optical components and systems to be performed in high bit rate. This module is a kind of pattern generator and bit error rate tester that can be used to modulate optical components or systems and to test the bit error rate characteristics of optical systems or optical lines. This pattern generator slot includes two differential Tx/Rx channels, which can be operated simultaneously.
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6031 -
Associated Equipment Corp.
• Tests for defective alternator diodes including GM trio test• Performs complete battery test• 125 Amp load checks state of charge • Searches for excess starter current and alternator/regulator output voltage• Includes test lead set (610271)• Made in USA of US and Global Components
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UWE Electronics
Test fixtures are a product for the test and the testing of printed circuit boards. The test adapters offered by uwe electronic are suitable for both manual testing and automated testing with vacuum operation. The test fixture can be either fully equipped and wired or delivered without installed components. Pneumatic, Mechanical and Vacuum Fixtures.
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Terotest Systems Ltd.
Terotest offers a full test programming service for all of our Automatic Test Equipment. In many cases test programs can be generated from CAD data on the product or component under test, or from autolearn facilities within the test system. Such techniques maximise accuracy and test program fault coverage, and allow quick and easy test program generation.
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MTQ Testsolutions AG
Control of Automated Test Equipment (ATE) for functional test and in-circuit testOperation of test facilities with adapters and PLCssemi- and fully automatic testing of electronic components and assembliesFinal Test in ProductionTest of pre-series and sample seriesStandardized test program developmentAdaptable to your own system environment (customizing) – 100% usable after installation with standard elements